Nonlinear refraction and absorption measurements of thin films by the dual-arm Z-scan method
نویسندگان
چکیده
منابع مشابه
Determination of nonlinear absorption and refraction by single Z-scan method
We report a simplified Z-scan technique based on a study on the symmetric features of a typical Z-scan curve. The contributions from the two-photon absorption (TPA) and the nonlinear refraction (NLR) are easily separated from a closed-aperture Z-scan curve using this method. And the determination of the two nonlinearities is simplified and unambiguous. We demonstrate this method on ZnSe, CdS, a...
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The techniques most often used to determine components of the third-order susceptibility, x(3), include degenerate four-wave mixing, 1 nearly degenerate threeand four-wave mixing, 2 ellipse rotation, 3 optical third-harmonic generation,4 photoacoustics,5 beam-distortion methods,6 8 and nonlinear transmission.9 Some of these have been adapted to measure the anisotropy of x<a) .2•5•6•9 We introdu...
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We use a white-light continuum (WLC) Z-scan technique to measure the degenerate two-photon absorption spectrum and associated dispersion of the nonlinear refraction in ZnSe. The spectral components of the WLC source are separated by using a narrow band variable filter to minimize nondegenerate nonlinearities. We observe a change in sign of the ultrafast nonlinear refractive index around 0.7 of ...
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We describe a sensitive technique for measuring nonlinear refraction in a variety of materials that offers simplicity, sensitivity and speed. The transmittance of a sample is measured through a finite aperture in the far -field as the sample is moved along the propagation path (z) of a focused Gaussian beam. The sign and magnitude of the nonlinearity is easily deduced from such a transmittance ...
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ژورنال
عنوان ژورنال: Applied Optics
سال: 2019
ISSN: 1559-128X,2155-3165
DOI: 10.1364/ao.58.000d28